MICROWAVE AND MILLIMETER WAVE TEST

INSTRUMENTS AND EXPERTISE

Benchmark offers comprehensive measurement capabilities from DC through millimeter wave (mmWave) frequencies. Armed with state-of-the-art microwave/mmWave test equipment, including broadband signal generators, vector network analyzers (VNAs), high-speed digital storage oscilloscopes (DSOs), and wideband spectrum analyzers, Benchmark’s product design and test development engineers, characterize components, circuits, and systems up to 110 GHz. Whether supporting product development or developing an automated test for scaled production, we provide customers with accurate results that ensure quality and performance for RF products.

Testing, troubleshooting, and tuning at mmWave frequencies is essential for a growing number of applications operating at frequencies of 24 GHz and higher, such as 5G New Radio (NR) cellular wireless networks. Our mmWave test, troubleshooting, and tuning are co-located with design engineering and manufacturing to accelerate the development and efficient production of new products. The RF testers we develop at our RF and High Speed Center of Innovation can be replicated and deployed to Benchmark sites worldwide to support higher-volume production. 

WE ACHIEVE RESULTS
  • Testing over broad and narrow bandwidths to 110 GHz
  • Production testing of antenna beamwidths in all global 5G NR frequency bands
  • Detection and analysis of high-speed mmWave pulses for automotive and military radar testing
  • Calibration of passive component (cables, filters, attenuators) losses at mmWave frequencies prior to system and network integration
  • Troubleshooting production problems to keep deliveries of high frequency products on-schedule
CAPABILITIES
  • Vector network analysis to 110 GHz
  • Generating complex signal waveforms at mmWave frequencies
  • Create advanced test signals, including frequency-hopped and spread-spectrum signals
  • Analyzing high-speed digital signals at speeds to 10 Gb/s
  • Spectrum analysis to 70 GHz
  • High-speed/high-frequency probe stations for on-wafer, chip-level measurements
  • Custom measurements for mixed-signal (analog, digital, mmWave) components and circuits